體驗區
|
| 篇名 |
662 ktv伽瑪射線在康普吞射線測量的可用性
|
| 並列篇名 |
THE APPLICABILITY OF 662 KEV T-RAYS TO COMPTON PROFILE MEASUREMENTS
|
| 作者 |
張秋男
、游政陸
、陳慶日
、黃坤福
、陳宏榮
|
| 中文摘要 |
662 kv伽玛射线对硅及锗单晶的三个方向＜100＞、＜110＞及＜111＞的背角散射能谱由纯锗低能量侦测器测得，并利用傅立叶转换的技术将之还原而得到硅与锗单晶在＜100＞、＜110＞及＜111＞方向的康谱吞摄像。此结果与由低能量光子或正子消灭等方法所得结果相比较，发现已相对论为基础得到的康普吞摄像是个定义清楚的概念，而用作康普吞摄像的r射线高达662kev仍然适用。故铯137放射原可用作康普吞摄像的伽玛射线源。
|
| 英文摘要 |
The 662 Kev γ-ray backscattered spectra of <100>-, <110>-and <111>-oriented Si and Ge were obtained by a HpGe low-energy detector. These spectra were then deconvoluted by a Fourier transformation technique. Compton profiles of <100>-, <110>- and <111>-oriented Si and Ge were deduced and compared with the existing data, which were obtained either by the method of lowenergy photons or by positron annihilation. The agreements are quite good, and we conclude that the Compton profile is γ-ray energy as high as 662 KeV. Cs137 can thus be considered as a good radioactive source for Compton Profile measurements. We have also found that the multiple scattering effect at this photon energy is more significant for Si than for Ge.
|
| 頁次 |
401-424
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| 關鍵詞 |
TSSCI
|
| 卷期 |
32:1
|
| 日期 |
1987
|
| 刊名 |
教育科學研究期刊
|
| 出版單位 |
國立臺灣師範大學
|
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